CMRR Research Review

Guest Speaker: Eric Fullerton (Director), Frank Talke, Raymond deCallafon, Sungho Jin, Fred Spada, Vitaliy Lomakin CMRR faculty members scheduled to speak at spring review Date: May 24th, 2012  to May 25th, 2011 Time: 8:30am-5p (Th); 8-12 Location: CMRR Auditorium, UC San Diego Host: CMRR

DESCRIPTION/ABSTRACT: By invitation only, the CMRR Research Review is organized by the Center for Magnetic Recording Research, under the leadership of CMRR Director Eric Fullerton. Topics slated to be discussed during the 1.5-day review include: tribology and mechanics; dynamic modeling and servo technology; design and fabrication of nanomagnetic materials; magnetic films and nanostructures; tape-head interface; micromagnetic modeling and recording physics; signal processing and coding; non-volatile, solid-state memory; and novel memory devices. SPEAKER BIO: Eric Fullerton is an Endowed Chair Professor and Director of UC San Diego\'s Center for Magnetic Recording Research (CMRR) and a professor in the department of Electrical and Computer Engineering of the Jacobs School of Engineering. Before joining UCSD in January 2007, Fullerton was a senior manager and research scientist in the Fundamentals of Nano-Structured Materials Group at Hitachi Global Storage Technologies (formerly IBM Almaden Research Center). He is a fellow of the American Physical Society, and a past winner of the Exceptional Achievement Award at Argonne National Laboratory, the IBM Outstanding Achievement Award, and the IBM Fourth Plateau Invention Achievement Award. Fullerton earned his Ph.D. at UCSD in 1991. Dr. Fullerton\'s expertise is in thin-film magnetic and nano-materials. He is an internationally acclaimed scholar in areas such as thin film and superlattice growth, magnetic recording and nano-technologies, and x-ray and neutron scattering. At IBM/Hitachi, Fullerton made fundamental advances in the development of high density magnetic recording media based on anti-ferromagnetically coupled ferromagnetic films. Early in his career, he developed a technique for mapping the structure of thin-film multi-layers from x-ray diffraction data that became the standard in the field.